Influence of post-deposition heat treatment on electrical transport properties of In2S3-buffered Cu(In,Ga)Se2 cells
Identifieur interne : 000A42 ( Main/Repository ); précédent : 000A41; suivant : 000A43Influence of post-deposition heat treatment on electrical transport properties of In2S3-buffered Cu(In,Ga)Se2 cells
Auteurs : RBID : Pascal:13-0229202Descripteurs français
- Pascal (Inist)
- Traitement thermique, Propriété électrique, Propriété transport, Caractéristique électrique, Cellule solaire, Recuit, Caractéristique courant tension, Interface, Diode, Mesure capacité électrique, Etat interface, Addition phosphore, Modification chimique, Séléniure d'indium, Sulfure d'indium, Cuivre, Gallium, Séléniure de cuivre, Séléniure de gallium, In2S3, He, 7350, 8460J, 7361.
- Wicri :
- concept : Cuivre.
English descriptors
- KwdEn :
- Annealing, Capacitance measurement, Chemical modification, Copper, Copper selenides, Diodes, Electrical characteristic, Electrical properties, Gallium, Gallium selenides, Heat treatments, IV characteristic, Indium selenides, Indium sulfide, Interface states, Interfaces, Phosphorus additions, Solar cells, Transport properties.
Abstract
The electrical characteristics of Cu(In,Ga)Se2-based solar cells with In2S3 buffer were investigated. The effects of post-deposition annealing in helium or in air on current-voltage characteristics, net acceptor density profiles and admittance spectra were studied. Analysis of the current-voltage characteristics showed that interface recombination dominated transport in the as-deposited devices was reduced after annealing and partially replaced by bulk recombination. This was accompanied by a decrease in the saturation current and diode ideality factor. The influence of the heat treatment on the buffer/hetero-interface region as determined by capacitance measurements was minor. We conclude that a reduction in the interface states density and in the p + layer doping caused by the chemical modification of the hetero-interface region is the major source of the improvement.
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Pascal:13-0229202Le document en format XML
<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Influence of post-deposition heat treatment on electrical transport properties of In<sub>2</sub>
S<sub>3</sub>
-buffered Cu(In,Ga)Se<sub>2 </sub>
cells</title>
<author><name sortKey="Abdel Maksoud, H" uniqKey="Abdel Maksoud H">H. Abdel Maksoud</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Faculty of Physics, Warsaw University of Technology</s1>
<s2>Warsaw</s2>
<s3>POL</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</inist:fA14>
<country>Pologne</country>
<wicri:noRegion>Warsaw</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Igalson, M" uniqKey="Igalson M">M. Igalson</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Faculty of Physics, Warsaw University of Technology</s1>
<s2>Warsaw</s2>
<s3>POL</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</inist:fA14>
<country>Pologne</country>
<wicri:noRegion>Warsaw</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Spiering, S" uniqKey="Spiering S">S. Spiering</name>
<affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Zentrum für Sonnenenergie- und Wasserstoff-Forschung (ZSW) Baden-Württemberg, Industriestrasse 6</s1>
<s2>70565 Stuttgart</s2>
<s3>DEU</s3>
<sZ>3 aut.</sZ>
</inist:fA14>
<country>Allemagne</country>
<wicri:noRegion>70565 Stuttgart</wicri:noRegion>
<wicri:noRegion>Industriestrasse 6</wicri:noRegion>
<wicri:noRegion>70565 Stuttgart</wicri:noRegion>
</affiliation>
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<publicationStmt><idno type="inist">13-0229202</idno>
<date when="2013">2013</date>
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<title level="j" type="main">Thin solid films</title>
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</fileDesc>
<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Annealing</term>
<term>Capacitance measurement</term>
<term>Chemical modification</term>
<term>Copper</term>
<term>Copper selenides</term>
<term>Diodes</term>
<term>Electrical characteristic</term>
<term>Electrical properties</term>
<term>Gallium</term>
<term>Gallium selenides</term>
<term>Heat treatments</term>
<term>IV characteristic</term>
<term>Indium selenides</term>
<term>Indium sulfide</term>
<term>Interface states</term>
<term>Interfaces</term>
<term>Phosphorus additions</term>
<term>Solar cells</term>
<term>Transport properties</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>Traitement thermique</term>
<term>Propriété électrique</term>
<term>Propriété transport</term>
<term>Caractéristique électrique</term>
<term>Cellule solaire</term>
<term>Recuit</term>
<term>Caractéristique courant tension</term>
<term>Interface</term>
<term>Diode</term>
<term>Mesure capacité électrique</term>
<term>Etat interface</term>
<term>Addition phosphore</term>
<term>Modification chimique</term>
<term>Séléniure d'indium</term>
<term>Sulfure d'indium</term>
<term>Cuivre</term>
<term>Gallium</term>
<term>Séléniure de cuivre</term>
<term>Séléniure de gallium</term>
<term>In2S3</term>
<term>He</term>
<term>7350</term>
<term>8460J</term>
<term>7361</term>
</keywords>
<keywords scheme="Wicri" type="concept" xml:lang="fr"><term>Cuivre</term>
</keywords>
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<front><div type="abstract" xml:lang="en">The electrical characteristics of Cu(In,Ga)Se<sub>2</sub>
-based solar cells with In<sub>2</sub>
S<sub>3</sub>
buffer were investigated. The effects of post-deposition annealing in helium or in air on current-voltage characteristics, net acceptor density profiles and admittance spectra were studied. Analysis of the current-voltage characteristics showed that interface recombination dominated transport in the as-deposited devices was reduced after annealing and partially replaced by bulk recombination. This was accompanied by a decrease in the saturation current and diode ideality factor. The influence of the heat treatment on the buffer/hetero-interface region as determined by capacitance measurements was minor. We conclude that a reduction in the interface states density and in the p + layer doping caused by the chemical modification of the hetero-interface region is the major source of the improvement.</div>
</front>
</TEI>
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<fA05><s2>535</s2>
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<fA08 i1="01" i2="1" l="ENG"><s1>Influence of post-deposition heat treatment on electrical transport properties of In<sub>2</sub>
S<sub>3</sub>
-buffered Cu(In,Ga)Se<sub>2 </sub>
cells</s1>
</fA08>
<fA09 i1="01" i2="1" l="ENG"><s1>E-MRS 2012 Symposium B</s1>
</fA09>
<fA11 i1="01" i2="1"><s1>ABDEL MAKSOUD (H.)</s1>
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<fA11 i1="02" i2="1"><s1>IGALSON (M.)</s1>
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<fA11 i1="03" i2="1"><s1>SPIERING (S.)</s1>
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<fA12 i1="01" i2="1"><s1>EDOFF (Marika)</s1>
<s9>ed.</s9>
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<fA12 i1="02" i2="1"><s1>ROMEO (Alessandro)</s1>
<s9>ed.</s9>
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<fA12 i1="03" i2="1"><s1>SCHEER (Roland)</s1>
<s9>ed.</s9>
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<fA12 i1="04" i2="1"><s1>SHAFARMAN (William)</s1>
<s9>ed.</s9>
</fA12>
<fA12 i1="05" i2="1"><s1>KATAGIRI (Hirono)</s1>
<s9>ed.</s9>
</fA12>
<fA14 i1="01"><s1>Faculty of Physics, Warsaw University of Technology</s1>
<s2>Warsaw</s2>
<s3>POL</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</fA14>
<fA14 i1="02"><s1>Zentrum für Sonnenenergie- und Wasserstoff-Forschung (ZSW) Baden-Württemberg, Industriestrasse 6</s1>
<s2>70565 Stuttgart</s2>
<s3>DEU</s3>
<sZ>3 aut.</sZ>
</fA14>
<fA18 i1="01" i2="1"><s1>European Materials Research Society (E-MRS)</s1>
<s2>Strasbourg</s2>
<s3>FRA</s3>
<s9>org-cong.</s9>
</fA18>
<fA20><s1>158-161</s1>
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<fA21><s1>2013</s1>
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<fA23 i1="01"><s0>ENG</s0>
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<fA43 i1="01"><s1>INIST</s1>
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<fA47 i1="01" i2="1"><s0>13-0229202</s0>
</fA47>
<fA60><s1>P</s1>
<s2>C</s2>
</fA60>
<fA61><s0>A</s0>
</fA61>
<fA64 i1="01" i2="1"><s0>Thin solid films</s0>
</fA64>
<fA66 i1="01"><s0>NLD</s0>
</fA66>
<fC01 i1="01" l="ENG"><s0>The electrical characteristics of Cu(In,Ga)Se<sub>2</sub>
-based solar cells with In<sub>2</sub>
S<sub>3</sub>
buffer were investigated. The effects of post-deposition annealing in helium or in air on current-voltage characteristics, net acceptor density profiles and admittance spectra were studied. Analysis of the current-voltage characteristics showed that interface recombination dominated transport in the as-deposited devices was reduced after annealing and partially replaced by bulk recombination. This was accompanied by a decrease in the saturation current and diode ideality factor. The influence of the heat treatment on the buffer/hetero-interface region as determined by capacitance measurements was minor. We conclude that a reduction in the interface states density and in the p + layer doping caused by the chemical modification of the hetero-interface region is the major source of the improvement.</s0>
</fC01>
<fC02 i1="01" i2="3"><s0>001B70C50</s0>
</fC02>
<fC02 i1="02" i2="X"><s0>001D06C02D1</s0>
</fC02>
<fC02 i1="03" i2="3"><s0>001B70C61</s0>
</fC02>
<fC02 i1="04" i2="X"><s0>230</s0>
</fC02>
<fC03 i1="01" i2="3" l="FRE"><s0>Traitement thermique</s0>
<s5>01</s5>
</fC03>
<fC03 i1="01" i2="3" l="ENG"><s0>Heat treatments</s0>
<s5>01</s5>
</fC03>
<fC03 i1="02" i2="3" l="FRE"><s0>Propriété électrique</s0>
<s5>02</s5>
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<fC03 i1="02" i2="3" l="ENG"><s0>Electrical properties</s0>
<s5>02</s5>
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<fC03 i1="03" i2="X" l="FRE"><s0>Propriété transport</s0>
<s5>03</s5>
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<fC03 i1="03" i2="X" l="ENG"><s0>Transport properties</s0>
<s5>03</s5>
</fC03>
<fC03 i1="03" i2="X" l="SPA"><s0>Propiedad transporte</s0>
<s5>03</s5>
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<s5>04</s5>
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<s5>04</s5>
</fC03>
<fC03 i1="04" i2="X" l="SPA"><s0>Característica eléctrica</s0>
<s5>04</s5>
</fC03>
<fC03 i1="05" i2="3" l="FRE"><s0>Cellule solaire</s0>
<s5>05</s5>
</fC03>
<fC03 i1="05" i2="3" l="ENG"><s0>Solar cells</s0>
<s5>05</s5>
</fC03>
<fC03 i1="06" i2="3" l="FRE"><s0>Recuit</s0>
<s5>06</s5>
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<s5>06</s5>
</fC03>
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<s5>07</s5>
</fC03>
<fC03 i1="07" i2="3" l="ENG"><s0>IV characteristic</s0>
<s5>07</s5>
</fC03>
<fC03 i1="08" i2="3" l="FRE"><s0>Interface</s0>
<s5>08</s5>
</fC03>
<fC03 i1="08" i2="3" l="ENG"><s0>Interfaces</s0>
<s5>08</s5>
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<s5>09</s5>
</fC03>
<fC03 i1="09" i2="3" l="ENG"><s0>Diodes</s0>
<s5>09</s5>
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<fC03 i1="10" i2="3" l="FRE"><s0>Mesure capacité électrique</s0>
<s5>10</s5>
</fC03>
<fC03 i1="10" i2="3" l="ENG"><s0>Capacitance measurement</s0>
<s5>10</s5>
</fC03>
<fC03 i1="11" i2="3" l="FRE"><s0>Etat interface</s0>
<s5>11</s5>
</fC03>
<fC03 i1="11" i2="3" l="ENG"><s0>Interface states</s0>
<s5>11</s5>
</fC03>
<fC03 i1="12" i2="3" l="FRE"><s0>Addition phosphore</s0>
<s5>12</s5>
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<s5>12</s5>
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<s5>13</s5>
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<fC03 i1="13" i2="X" l="ENG"><s0>Chemical modification</s0>
<s5>13</s5>
</fC03>
<fC03 i1="13" i2="X" l="SPA"><s0>Modificación química</s0>
<s5>13</s5>
</fC03>
<fC03 i1="14" i2="3" l="FRE"><s0>Séléniure d'indium</s0>
<s2>NK</s2>
<s5>14</s5>
</fC03>
<fC03 i1="14" i2="3" l="ENG"><s0>Indium selenides</s0>
<s2>NK</s2>
<s5>14</s5>
</fC03>
<fC03 i1="15" i2="X" l="FRE"><s0>Sulfure d'indium</s0>
<s5>15</s5>
</fC03>
<fC03 i1="15" i2="X" l="ENG"><s0>Indium sulfide</s0>
<s5>15</s5>
</fC03>
<fC03 i1="15" i2="X" l="SPA"><s0>Indio sulfuro</s0>
<s5>15</s5>
</fC03>
<fC03 i1="16" i2="3" l="FRE"><s0>Cuivre</s0>
<s2>NC</s2>
<s5>16</s5>
</fC03>
<fC03 i1="16" i2="3" l="ENG"><s0>Copper</s0>
<s2>NC</s2>
<s5>16</s5>
</fC03>
<fC03 i1="17" i2="3" l="FRE"><s0>Gallium</s0>
<s2>NC</s2>
<s5>17</s5>
</fC03>
<fC03 i1="17" i2="3" l="ENG"><s0>Gallium</s0>
<s2>NC</s2>
<s5>17</s5>
</fC03>
<fC03 i1="18" i2="3" l="FRE"><s0>Séléniure de cuivre</s0>
<s2>NK</s2>
<s5>18</s5>
</fC03>
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<s2>NK</s2>
<s5>18</s5>
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<s2>NK</s2>
<s5>19</s5>
</fC03>
<fC03 i1="19" i2="3" l="ENG"><s0>Gallium selenides</s0>
<s2>NK</s2>
<s5>19</s5>
</fC03>
<fC03 i1="20" i2="3" l="FRE"><s0>In2S3</s0>
<s4>INC</s4>
<s5>46</s5>
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<fC03 i1="21" i2="3" l="FRE"><s0>He</s0>
<s4>INC</s4>
<s5>47</s5>
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<s4>INC</s4>
<s5>71</s5>
</fC03>
<fC03 i1="23" i2="3" l="FRE"><s0>8460J</s0>
<s4>INC</s4>
<s5>72</s5>
</fC03>
<fC03 i1="24" i2="3" l="FRE"><s0>7361</s0>
<s4>INC</s4>
<s5>73</s5>
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<fN21><s1>210</s1>
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<fN44 i1="01"><s1>OTO</s1>
</fN44>
<fN82><s1>OTO</s1>
</fN82>
</pA>
<pR><fA30 i1="01" i2="1" l="ENG"><s1>E-MRS Spring Meeting 2012. Symposium B "Thin Film Chalcogenide Photovoltaic Materials"</s1>
<s3>Strasbourg FRA</s3>
<s4>2012-05-14</s4>
</fA30>
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